TATTL: the automated thermal test lab

Fourth Annual IEEE Semiconductor Thermal and Temperature Measurement Symposium Pub Date : 1988-02-10 DOI:10.1109/SEMTHE.1988.10616

J. Hayward

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Abstract

The development of the automated thermal test lab (TATTL) at Advanced Micro Devices originated in the need to improve the efficiency and resource utilization for the thermal characterization services provided by the Materials Research Laboratory. TATTL is a set of Fortran-77 real-time data acquisition and control modules which integrate the variety of instrumentation required for the performance of device calibration and junction-to-case thermal resistance, natural-convection, and forced-convection testing. The TATTL modules provided a complete environment within which thermal testing is performed and they are built on a central database unifying the information needed during testing and subsequent reporting of results. The architecture of the TATTL system and the hardware and software used in this implementation are described. Communication with instrumentation, operation in a real-time environment, and structuring of data for efficient transfer and report generation are discussed. The software runs on a DEC QBUS system, but in this discussion, emphasis is placed on the system structure rather than the details of coding.<>

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自动化热测试实验室

Advanced Micro Devices的自动化热测试实验室(TATTL)的发展源于提高材料研究实验室提供的热表征服务的效率和资源利用的需要。TATTL是一套Fortran-77实时数据采集和控制模块，集成了设备校准和结壳热阻，自然对流和强制对流测试所需的各种仪器。TATTL模块提供了一个执行热测试的完整环境，它们建立在一个中央数据库上，统一了测试和随后报告结果期间所需的信息。介绍了该系统的体系结构以及实现过程中使用的硬件和软件。讨论了与仪器的通信，实时环境中的操作，以及有效传输和生成报告的数据结构。该软件运行在DEC QBUS系统上，但在本讨论中，重点放在系统结构而不是编码细节上。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Fourth Annual IEEE Semiconductor Thermal and Temperature Measurement Symposium

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