{"title":"Fine Pitch Tab-lsi Interconnection Technology In MCM","authors":"F. Mori, K. Kudo, K. Tsukamoto","doi":"10.1109/IEMT.1993.639808","DOIUrl":null,"url":null,"abstract":"The quest for higher processing speed of supercomputers and mainframes has made the technology for high-density packaging extremely important. The authors have developed a new technology that permits us to connect multi-pin (487 pins) ultra-fast logic LSIs on a ceramic substrate with a fine pitch of 110 μm using TAB (Tape Automated Bonding). By developing new materials, bonding process, and manufacturing facilities, the authors were able to achieve a connection pitch finer than that which conventional technology can offer. As a result, they were able to develop an ultra-fine pitch, high-density, and high reliability packaging technology that allowed them to produce high-performance computer systems","PeriodicalId":170695,"journal":{"name":"Proceedings of Japan International Electronic Manufacturing Technology Symposium","volume":"50 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1993-06-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of Japan International Electronic Manufacturing Technology Symposium","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IEMT.1993.639808","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
The quest for higher processing speed of supercomputers and mainframes has made the technology for high-density packaging extremely important. The authors have developed a new technology that permits us to connect multi-pin (487 pins) ultra-fast logic LSIs on a ceramic substrate with a fine pitch of 110 μm using TAB (Tape Automated Bonding). By developing new materials, bonding process, and manufacturing facilities, the authors were able to achieve a connection pitch finer than that which conventional technology can offer. As a result, they were able to develop an ultra-fine pitch, high-density, and high reliability packaging technology that allowed them to produce high-performance computer systems