Development of a self-aligned pnp HBT for a complementary thin-SOI SiGeC BiCMOS technology

J. Duvernay, F. Brossard, G. Borot, L. Boissonnet, B. Vandelle, L. Rubaldo, F. Deleglise, G. Avenier, P. Chevalier, B. Rauber, D. Dutartre, A. Chantre
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引用次数: 8

Abstract

This paper describes the development of a thin-SOI pnp SiGeC HBT using a self-aligned selective epitaxy emitter/base architecture. Static and dynamic device characteristics are presented, and first results from a full 130 nm thin-SOI complementary SiGeC BiCMOS technology are reported.
用于互补薄soi SiGeC BiCMOS技术的自对准pnp HBT的开发
本文描述了一种使用自对准选择性外延发射极/基极结构的薄soi pnp SiGeC HBT的开发。介绍了器件的静态和动态特性,并报道了130 nm全薄soi互补SiGeC BiCMOS技术的第一个结果。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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