Neutron single event effect test results for various SRAM memories

1997 IEEE Radiation Effects Data Workshop NSREC Snowmass 1997. Workshop Record Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference Pub Date : 1997-07-24 DOI:10.1109/REDW.1997.629799

D. Thouvenot, P. Trochet, R. Gaillard, F. Desnoyers

引用次数: 9

Abstract

This paper presents the results of a SEE neutron evaluation carried out on five SRAM types. Sensitivity to the power supply, test pattern and memory cell structures were investigated.

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不同SRAM存储器的中子单事件效应测试结果

本文介绍了对五种SRAM类型进行SEE中子评价的结果。研究了对电源、测试模式和存储单元结构的灵敏度。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

1997 IEEE Radiation Effects Data Workshop NSREC Snowmass 1997. Workshop Record Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference

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