Constant-charge-injection programming for 10-MB/s multilevel AG-AND flash memories

H. Kurata, S. Saeki, T. Kobayashi, Y. Sasago, T. Kawahara
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引用次数: 9

Abstract

The demand for high-density, high-speed programming in flash memories has been increasing because their expanding applications in portable equipment such as digital still cameras and music players. A multilevel technique is one of the most effective approaches for improving memory density. But long cell programming time and precise control of the memory cell's threshold voltage (Vth) degrade its programming performance. To realize fast cell programming, we have developed a so-called assist-gate (AG)-AND-type flash cell, in which programming is performed by source side channel hot electron injection (SSI). In this paper, we developed a constant-charge-injection programming, which realizes fast precise control of Vth by suppressing the characteristic deviation. By utilizing proposed scheme, we achieved. 10.3-MB/s programming throughput in multilevel AG-AND flash memories.
用于10mb /s多级ag和闪存的恒定电荷注入编程
由于闪存在数码相机和音乐播放器等便携式设备中的应用越来越广泛,对其高密度、高速编程的需求一直在增加。多层技术是提高记忆密度最有效的方法之一。但由于单元编程时间过长,存储单元阈值电压控制不精确,导致其编程性能下降。为了实现快速单元编程,我们开发了一种所谓的辅助门(AG)和型闪存单元,其中编程是通过源侧通道热电子注入(SSI)来完成的。本文提出了一种恒电荷注入编程方法,通过抑制特性偏差实现对Vth的快速精确控制。利用所提出的方案,我们实现了。多电平AG-AND闪存的编程吞吐量为10.3 mb /s。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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