Measurement of facet optical absorption in high power diode lasers using thermoreflectance

A. Jha, P. Leisher, Chen Li, K. Pipe, M. Crowley, D. Fullager, J. Helmrich, P. Thiagarajan, R. Deri, R. Swertfeger
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引用次数: 1

Abstract

Severe heating due to partial absorption of outcoupled emission at the facet of a high-power diode laser can lead to catastrophic optical damage. The degree of absorption and subsequent heating at the facet is a function of the emission wavelength, the absorption properties of facet coatings and passivation layers, and the age of the device. The ability to quantify facet absorption is an essential step toward improving the reliability of diode laser systems and rapid development of passivation technologies. In this work, we have developed a technique to measure facet absorption in diode lasers using a combination of facet thermoreflectance imaging and a heat transport model. The approach can be used for a wide range of both coated and uncoated diode lasers.
利用热反射率测量高功率二极管激光器的表面光吸收
高功率二极管激光器由于部分吸收外耦合发射而产生的严重加热会导致灾难性的光学损伤。facet的吸收程度和随后的加热是发射波长、facet涂层和钝化层的吸收特性以及器件年龄的函数。量化面吸收的能力是提高二极管激光系统可靠性和快速发展钝化技术的重要一步。在这项工作中,我们开发了一种技术来测量二极管激光器的小面吸收,使用小面热反射成像和热传输模型的组合。该方法可用于广泛的涂覆和非涂覆二极管激光器。
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