Functional Built-In Self-Test for processor cores in SoC

R. Ubar, Viljar Indus, Oliver Kalmend, T. Evartson, E. Orasson
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引用次数: 4

Abstract

A methodology for organization of at-speed functional Built-In Self-Test in processors, based on real functional routines is presented. The proposed self-test includes on-chip test application and response collection by using the functionality of the processor under test. We use divide-and-conquer approach. At component level, tests are targeting faults in components. At processor level, the functionality of the processor is used to apply functional test patterns to each component at-speed. Differently from usual Built-in Self-Test schemes, the test patterns are not needed to store in the chip under test, they will be generated on-line by the resources of the system.
功能内置自检处理器内核在SoC
提出了一种基于实际功能例程的处理器高速功能内置自检的组织方法。建议的自检包括通过使用被测处理器的功能进行片上测试应用和响应收集。我们采用分而治之的方法。在组件级别,测试针对组件中的错误。在处理器级别,处理器的功能用于将功能测试模式快速应用于每个组件。与通常的内置自测方案不同,测试模式不需要存储在被测芯片中,它们将由系统资源在线生成。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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