A radiation-hardened cold sparing input/output buffer manufactured on a commercial process line

1999 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.99TH8463) Pub Date : 1999-07-12 DOI:10.1109/REDW.1999.816060

J. Benedetto, A. Jordan

引用次数: 3

Abstract

The radiation hardness of a cold sparing buffer manufactured on a commercial process line is demonstrated. The buffer is shown to be resistant to total dose ionizing radiation and immune (>128 MeV-cm/sup 2//mg) to effects from heavy ions such as single event upset (SEU) and single event latch-up (SEL).

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在商业生产线上生产的抗辐射冷保护输入/输出缓冲器

演示了在商业工艺线上生产的冷保护缓冲液的辐射硬度。该缓冲液具有抗总剂量电离辐射和免疫(>128 MeV-cm/sup 2//mg)重离子效应，如单事件扰动(SEU)和单事件闭锁(SEL)。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

1999 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.99TH8463)

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