Radiation damage effects on X- and gamma-ray N/sup +/NPP/sup +/ silicon detectors

Abstract

The paper describes some results concerning technology and behaviour of Xand gamma-ray N/sup +/PP/sup +/ silicon detectors used in physics research, industrial and medical radiography, and non-destructive testing. Devices manufactured under this technology proved to be stable after an exposure in high intensity gamma field with the dose range of 10 krad-5 Mrad. Nuclear radiation resistance was studied by irradiation with /sup 60/Co gamma source (1.17, 1.33 MeV) at dose rates of 59 krad/hour and 570 krad/hour.