{"title":"Fault tolerant Four-State Logic by using Self-Healing Cells","authors":"T. Panhofer, W. Friesenbichler, M. Delvai","doi":"10.1109/ICCD.2008.4751832","DOIUrl":null,"url":null,"abstract":"The trend towards higher integration and faster operating speed leads to decreasing feature sizes and lower supply voltages in modern integrated circuits. These properties make the circuits more error-prone, requiring a fault tolerant implementation for applications demanding high reliability, e.g. space missions. In previous work we presented a concept how to obtain fault tolerant digital circuits by using asynchronous four-state logic (FSL). This type of logic already exhibits a high degree of fault tolerance where most faults simply halt the circuit (deadlock). The remaining types of faults are handled by temporal redundancy. Adding a deadlock detection unit and introducing the concept of self-healing cells (SHCs) leads to a highly reliable circuit that is able to tolerate even multiple faults. However our experiments revealed that some specific fault constellations neither cause a deadlock nor are they detected by a redundant calculation. We present two improved ways of error detection, which allow to capture even these types of faults. Further, a comparison between the size of an SHC and the achieved fault tolerance wrt. multiple faults is performed.","PeriodicalId":345501,"journal":{"name":"2008 IEEE International Conference on Computer Design","volume":"42 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2008-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"11","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2008 IEEE International Conference on Computer Design","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICCD.2008.4751832","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 11
Abstract
The trend towards higher integration and faster operating speed leads to decreasing feature sizes and lower supply voltages in modern integrated circuits. These properties make the circuits more error-prone, requiring a fault tolerant implementation for applications demanding high reliability, e.g. space missions. In previous work we presented a concept how to obtain fault tolerant digital circuits by using asynchronous four-state logic (FSL). This type of logic already exhibits a high degree of fault tolerance where most faults simply halt the circuit (deadlock). The remaining types of faults are handled by temporal redundancy. Adding a deadlock detection unit and introducing the concept of self-healing cells (SHCs) leads to a highly reliable circuit that is able to tolerate even multiple faults. However our experiments revealed that some specific fault constellations neither cause a deadlock nor are they detected by a redundant calculation. We present two improved ways of error detection, which allow to capture even these types of faults. Further, a comparison between the size of an SHC and the achieved fault tolerance wrt. multiple faults is performed.