Automation Of Memory Failure Analysis By Combining An Expert System With A Memory Tester/analyzer

Abstract

This paper presents a methodology by which predictions of memory failure are made prior to manufacturing. Based on these predictions and supporting historical data, expert rules are automatically created and used in conjunction with a memory tester/analyzer to determine the underlying physical causes of particular memory device failures. The histogram of the failure causes for a given lot can then be plotted and evaluated. Examples of the appIication of this methodology 10 the manufacture of 4 Mbit DRAMS are given.