{"title":"Raspberry Pi Zero and 3B+ SEE and TID Test Results","authors":"S. Guertin, Sergeh Vartanian, A. Daniel","doi":"10.1109/REDW56037.2022.9921679","DOIUrl":null,"url":null,"abstract":"We report SEE and TID testing of Raspberry Pi Zero and Raspberry Pi 3B+ computers. SEFI modes, display errors, and file transfer failures dominated the responses.","PeriodicalId":202271,"journal":{"name":"2022 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2022 NSREC)","volume":"15 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2022-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2022 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2022 NSREC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/REDW56037.2022.9921679","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2
Abstract
We report SEE and TID testing of Raspberry Pi Zero and Raspberry Pi 3B+ computers. SEFI modes, display errors, and file transfer failures dominated the responses.