A 0.75V 0.016mm2 12ENOB 7nm CMOS cyclic ADC with 1.5bit passive amplification stage and dynamic capacitance scaling

T. Oshima, Keisuke Yamamoto, G. Ono
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Abstract

A tiny but high-resolution cyclic ADC is presented with 7nm CMOS process. The 1.5bit/stage cyclic ADC performs fully differential sampling and passive residue amplification for small size and power. Proposed dynamic capacitance scaling overcomes limited power efficiency and input bandwidth of traditional cyclic ADCs. A time-assisted comparator makes ternary decision with minimal overhead. Measurement results of the 7nm CMOS prototype proved 4MS/s conversion rate and 74.0dB SNDR with 0.016mm2 and 0.86mW under 0.75V supply. This ADC advances the state of the art in design of high-resolution FinFET ADCs and cyclic ADCs.
一个0.75V 0.016mm2 12ENOB 7nm CMOS循环ADC,具有1.5位无源放大级和动态电容缩放
提出了一种采用7nm CMOS工艺的小型高分辨率循环ADC。1.5位/级循环ADC可实现小尺寸和小功率的全差分采样和无源残留放大。提出的动态电容缩放克服了传统循环adc有限的功率效率和输入带宽。时间辅助比较器以最小的开销进行三元决策。7nm CMOS样机的测试结果表明,在0.75V电源下,在0.016mm2和0.86mW条件下,转换速率为4MS/s, SNDR为74.0dB。该ADC推进了高分辨率FinFET ADC和循环ADC设计的最新水平。
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