{"title":"Lithographic Simulator Based on Deep Learning with Graph Input","authors":"Peng Xu, Pengpeng Yuan, Yayi Wei","doi":"10.1109/CSTIC52283.2021.9461424","DOIUrl":null,"url":null,"abstract":"This paper discuss a simple deep neural network which aimed to finish the simulation of the lithographic process. It can be finalized by a more comprehensive model formed by combined networks each for different parts of lithographic process. The advantage of the DNN is that it uses a graph input as the representation of the layout. As a result it can be easily combined with the current industrial software. Furthermore, this DNN can be applied reversely to generate a regularized pattern from data of current commercial ILT package. It will at least improve the manufacturability of ILT results generated by the current commercial package.","PeriodicalId":186529,"journal":{"name":"2021 China Semiconductor Technology International Conference (CSTIC)","volume":"13 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2021-03-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2021 China Semiconductor Technology International Conference (CSTIC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CSTIC52283.2021.9461424","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
This paper discuss a simple deep neural network which aimed to finish the simulation of the lithographic process. It can be finalized by a more comprehensive model formed by combined networks each for different parts of lithographic process. The advantage of the DNN is that it uses a graph input as the representation of the layout. As a result it can be easily combined with the current industrial software. Furthermore, this DNN can be applied reversely to generate a regularized pattern from data of current commercial ILT package. It will at least improve the manufacturability of ILT results generated by the current commercial package.