F. Udrea, P.R. Waind, J. Thomson, T. Trajkovic, S.S.M. Chan, S. Huang, G. Amaratunga
{"title":"1.4 kV, 25 A, PT and NPT trench IGBTs with optimum forward characteristics","authors":"F. Udrea, P.R. Waind, J. Thomson, T. Trajkovic, S.S.M. Chan, S. Huang, G. Amaratunga","doi":"10.1109/ISPSD.1999.764082","DOIUrl":null,"url":null,"abstract":"In this paper, we report the development of 1.4 kV 25 A punch-through (PT) and nonpunch-through (NPT) trench IGBTs with ultra-low on-resistance, latch-up free operation and highly superior overall performance when compared to previously reported DMOS IGBTs in the same class. We have fabricated both PT and transparent anode NPT devices to cover a wide range of applications which require very low on-state losses or very fast time with ultra-low switching losses. The minimum forward voltage drop at the standard current density of 100 A/cm/sup 2/ was 1.1 V for PT nonirradiated devices and 2.1 V for 16 MRad PT irradiated devices. The nonirradiated transparent emitter NPT structure has a typical forward voltage drop of 2.2 V, a turn-off time below 100 ns and turn-off energy losses of 11.2 mW/cm/sup 2/ at 125 C. The maximum controllable current density was in excess of 1000 A/cm/sup 2/.","PeriodicalId":352185,"journal":{"name":"11th International Symposium on Power Semiconductor Devices and ICs. ISPSD'99 Proceedings (Cat. No.99CH36312)","volume":"10 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"11th International Symposium on Power Semiconductor Devices and ICs. ISPSD'99 Proceedings (Cat. No.99CH36312)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISPSD.1999.764082","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 6
Abstract
In this paper, we report the development of 1.4 kV 25 A punch-through (PT) and nonpunch-through (NPT) trench IGBTs with ultra-low on-resistance, latch-up free operation and highly superior overall performance when compared to previously reported DMOS IGBTs in the same class. We have fabricated both PT and transparent anode NPT devices to cover a wide range of applications which require very low on-state losses or very fast time with ultra-low switching losses. The minimum forward voltage drop at the standard current density of 100 A/cm/sup 2/ was 1.1 V for PT nonirradiated devices and 2.1 V for 16 MRad PT irradiated devices. The nonirradiated transparent emitter NPT structure has a typical forward voltage drop of 2.2 V, a turn-off time below 100 ns and turn-off energy losses of 11.2 mW/cm/sup 2/ at 125 C. The maximum controllable current density was in excess of 1000 A/cm/sup 2/.