Automated synthesis of a multiple-sequence test generator using 2-D LFSR

Abstract

Given a set of pre-computed test vectors obtained by an automatic test pattern generation (ATPG) tool for detecting random-pattern-resistant faults or particular hard-to-test faults presented in a circuit under test (CUT), a simple test generator based on a 2D linear feedback shift register (LFSR) structure is presented in this paper to generate a given test, followed by random patterns. Not only generating deterministic test vectors, the synthesized test generator also has a 2-D LFSR structure which generates better random patterns than a conventional LFSR. Experimental results are provided for practical circuits to demonstrate the effectiveness of the scheme. The scheme allows a trade-off between test vector storage and test hardware. A synthesis procedure of designing this test generator is presented.