{"title":"An optimized and unified system for FPGA power-up validation to minimize post-silicon cycling time","authors":"Hua Hua, Hongpeng Han","doi":"10.1109/CSTIC.2015.7153467","DOIUrl":null,"url":null,"abstract":"Power-up validation is a critical process in R&D of FPGA, since it will determine if a FPGA can work correctly at the very first step of operation. Power-up validation includes 4 separate blocks. Testing each block one by one couldn't meet today's short time-to market requirement for a new product. In this paper, an optimized and unified system is proposed to perform validation for all power-up items. The validation efficiency was improved by several times comparing to the traditional approach. The experimental results indicate nearly 90% test time can be saved for the power-up validation.","PeriodicalId":130108,"journal":{"name":"2015 China Semiconductor Technology International Conference","volume":"63 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2015-03-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2015 China Semiconductor Technology International Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CSTIC.2015.7153467","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
Power-up validation is a critical process in R&D of FPGA, since it will determine if a FPGA can work correctly at the very first step of operation. Power-up validation includes 4 separate blocks. Testing each block one by one couldn't meet today's short time-to market requirement for a new product. In this paper, an optimized and unified system is proposed to perform validation for all power-up items. The validation efficiency was improved by several times comparing to the traditional approach. The experimental results indicate nearly 90% test time can be saved for the power-up validation.