Easily testable multiple-valued cellular arrays

Abstract

An easily testable k-valued cellular array consisting of input arrays and a control array that requires fewer cells than other methods is proposed. Stuck-at, open, and AND bridging faults are treated under the assumption that a single fault occurs in the array. Test input vectors can be easily generated from control inputs that specify the switches of cells. It is shown that a faulty cell can be effectively diagnosed by using several observable terminals and (k+1)-valued logic values.<>