Operation and Stability Analysis of Temperature-Insensitive MOS Reference Current Source with Self-Bias Circuit

Souma Yamamoto, Kuswan Isam Ebisawa, Yudai Abe, Takashi Ida, Y. Shibasaki, N. Tsukiji, A. Kuwana, Haruo Kobayashi, Akira Suzuki, Yukichi Todoroki, Toshihiko Kakinoki, Nobuto Ono, Kazuhiro Miura
{"title":"Operation and Stability Analysis of Temperature-Insensitive MOS Reference Current Source with Self-Bias Circuit","authors":"Souma Yamamoto, Kuswan Isam Ebisawa, Yudai Abe, Takashi Ida, Y. Shibasaki, N. Tsukiji, A. Kuwana, Haruo Kobayashi, Akira Suzuki, Yukichi Todoroki, Toshihiko Kakinoki, Nobuto Ono, Kazuhiro Miura","doi":"10.1109/ISOCC50952.2020.9332805","DOIUrl":null,"url":null,"abstract":"This paper analyzes our proposed temperature-insensitive MOS reference current source. It uses a self-bias circuit with feedback configuration, which may cause the circuit instability. Its stability condition has been investigated based on feedback theory as well as simulation.","PeriodicalId":270577,"journal":{"name":"2020 International SoC Design Conference (ISOCC)","volume":"7 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2020-10-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2020 International SoC Design Conference (ISOCC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISOCC50952.2020.9332805","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1

Abstract

This paper analyzes our proposed temperature-insensitive MOS reference current source. It uses a self-bias circuit with feedback configuration, which may cause the circuit instability. Its stability condition has been investigated based on feedback theory as well as simulation.
带自偏置电路的温度不敏感MOS基准电流源的工作及稳定性分析
本文分析了我们提出的温度不敏感MOS参考电流源。它采用带有反馈结构的自偏置电路,可能导致电路不稳定。基于反馈理论和仿真对其稳定性条件进行了研究。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信