J. Stalnaker, S. Diddams, K. Kim, L. Hollberg, E. Donley, T. Heavner, S. Jefferts, F. Levi, T. Parker, J. Bergquist, W. Itano, M. Jensen, L. Lorini, W. Oskay, T. Fortier
{"title":"Absolute Optical Frequency Measurements with a Fractional Frequency Uncertainty at 1 × 10-15","authors":"J. Stalnaker, S. Diddams, K. Kim, L. Hollberg, E. Donley, T. Heavner, S. Jefferts, F. Levi, T. Parker, J. Bergquist, W. Itano, M. Jensen, L. Lorini, W. Oskay, T. Fortier","doi":"10.1109/FREQ.2006.275430","DOIUrl":null,"url":null,"abstract":"We report the technical details specific to our recent measurements of the optical frequency of the mercury single-ion frequency standard in terms of the SI second as realized by the NIST-F1 cesium fountain clock. In these measurements the total fractional uncertainty is ap 10-15, limited by the statistical measurement uncertainty. In this paper we will address the techniques employed for the optical-to-microwave comparison itself, which had an estimated fractional uncertainty of ap 3 times 10-16, limited by the stability of the electronics used for the comparison","PeriodicalId":445945,"journal":{"name":"2006 IEEE International Frequency Control Symposium and Exposition","volume":"90 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2006-06-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2006 IEEE International Frequency Control Symposium and Exposition","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/FREQ.2006.275430","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
We report the technical details specific to our recent measurements of the optical frequency of the mercury single-ion frequency standard in terms of the SI second as realized by the NIST-F1 cesium fountain clock. In these measurements the total fractional uncertainty is ap 10-15, limited by the statistical measurement uncertainty. In this paper we will address the techniques employed for the optical-to-microwave comparison itself, which had an estimated fractional uncertainty of ap 3 times 10-16, limited by the stability of the electronics used for the comparison