Cryogenic and high temperature performance of 4H-SiC vertical junction field effect transistors (VJFETs) for space applications

Abstract

In this paper, we present an investigation on the different aspects of the performance of a 600V, 3A 4H-SiC vertical-trench junction field effect transistor (VJFET) at cryogenic and high temperatures. Some critical device physics related factors that affect the DC characteristics and switching performance of the device are explored. In particular, the experimental low-temperature performance of 4H-SiC VJFETs (down to 30K or -243/spl deg/C) is presented for the first time to our knowledge.