New reliability growth model

Abstract

The reliability growth model (RGM) is a very specific tool used during the development phase of electronic devices and software products. The new unconventional reliability growth models are based on the homogenity testing of different Poisson process characteristics. This makes it possible to find the time frame for finishing the technological constructing operations for further reliability growth in the next design of an electronic object. In this paper we review one new unconventional reliability growth model of electronic devices.