Effects of shielding enclosures on the breakdown failure rate of electronic equipment

H. Herlemann, S. Fisahn, M. Koch, H. Garbe
{"title":"Effects of shielding enclosures on the breakdown failure rate of electronic equipment","authors":"H. Herlemann, S. Fisahn, M. Koch, H. Garbe","doi":"10.1109/EMCEUROPE.2008.4786905","DOIUrl":null,"url":null,"abstract":"As a criterion of quality of a shield regarding its ability to protect electronic equipment against electromagnetic pulses, the breakdown failure rate of an operating test equipment with and without the shield can be compared [1]. In this contribution, the shielding behavior of cubical shields with varying rectangular slots against ultra wideband pulses of double exponential wave form is studied. It is found out, that applying the shield may have the effect, that electronic equipment becomes even more vulnerable to pulses due to resonance effects inside the enclosure. The results of these examinations in time domain are compared to results in frequency domain which can be found in literature [2].","PeriodicalId":133902,"journal":{"name":"2008 International Symposium on Electromagnetic Compatibility - EMC Europe","volume":"4 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2008-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2008 International Symposium on Electromagnetic Compatibility - EMC Europe","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EMCEUROPE.2008.4786905","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1

Abstract

As a criterion of quality of a shield regarding its ability to protect electronic equipment against electromagnetic pulses, the breakdown failure rate of an operating test equipment with and without the shield can be compared [1]. In this contribution, the shielding behavior of cubical shields with varying rectangular slots against ultra wideband pulses of double exponential wave form is studied. It is found out, that applying the shield may have the effect, that electronic equipment becomes even more vulnerable to pulses due to resonance effects inside the enclosure. The results of these examinations in time domain are compared to results in frequency domain which can be found in literature [2].
屏蔽外壳对电子设备击穿故障率的影响
作为衡量屏蔽屏蔽对电子设备抗电磁脉冲保护能力好坏的一个标准,可以比较有屏蔽屏蔽和无屏蔽屏蔽运行试验设备的击穿故障率[1]。本文研究了不同矩形槽的立方体屏蔽体对双指数波形超宽带脉冲的屏蔽性能。人们发现,应用屏蔽可能会产生影响,由于外壳内的共振效应,电子设备变得更容易受到脉冲的影响。将这些时域检验的结果与文献[2]中频域检验的结果进行比较。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信