Development of facilities for investigating single-event effects

Abstract

Energetic heavy-ion irradiation apparatus has been developed for single-event effects (SEE) testing. We have applied three irradiation methods, scattered-ion irradiation method, a recoiled-atom irradiation method, and a direct-beam irradiation method to perform SEE testing efficiently. For the study of basic mechanisms of single-event upset, we have developed a transient current measurement system by combining focused high-energy ion microbeams with a wide bandwidth digitizing sampling technique. The waveform of transient current induced by an energetic heavy-ion strike on a silicon test diode was measured with 1 /spl mu/m positioning accuracy. We succeeded in experimental separation of the delayed diffusion current from the prompt drift and funneling currents.