A. Valsaraj, Jiwon Chang, L. F. Register, S. Banerjee
{"title":"Effect of HfO2 and Al2O3 on monolayer MoS2 electronic structure","authors":"A. Valsaraj, Jiwon Chang, L. F. Register, S. Banerjee","doi":"10.1109/DRC.2014.6872310","DOIUrl":null,"url":null,"abstract":"Transition metal dichalcogenides (TMDs) are novel, and unlike graphene, gapped 2D materials with unique electrical and optical properties that are being explored for novel device applications. Their 2D nature also makes their properties sensitive to the surrounding environment. For example, a free standing monolayer of MoS<sub>2</sub> - which has an experimentally reported direct band gap of E<sub>g</sub> ≈ 1.8 eV<sup>1</sup> - has a very low reported mobility (μ<;3 cm<sup>2</sup>/(V-s)),<sup>2</sup> but exhibits significant enhancement of its mobility (μ~200 cm<sup>2</sup>/(V-s)) when superposed with a high-k dielectric like HfO<sub>2</sub>.<sup>3</sup> Here, we study the effect of HfO<sub>2</sub> and Al<sub>2</sub>O<sub>3</sub> on monolayer MoS<sub>2</sub> using density functional theory (DFT).","PeriodicalId":293780,"journal":{"name":"72nd Device Research Conference","volume":"16 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2014-06-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"72nd Device Research Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DRC.2014.6872310","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
Transition metal dichalcogenides (TMDs) are novel, and unlike graphene, gapped 2D materials with unique electrical and optical properties that are being explored for novel device applications. Their 2D nature also makes their properties sensitive to the surrounding environment. For example, a free standing monolayer of MoS2 - which has an experimentally reported direct band gap of Eg ≈ 1.8 eV1 - has a very low reported mobility (μ<;3 cm2/(V-s)),2 but exhibits significant enhancement of its mobility (μ~200 cm2/(V-s)) when superposed with a high-k dielectric like HfO2.3 Here, we study the effect of HfO2 and Al2O3 on monolayer MoS2 using density functional theory (DFT).