Effect of HfO2 and Al2O3 on monolayer MoS2 electronic structure

A. Valsaraj, Jiwon Chang, L. F. Register, S. Banerjee
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Abstract

Transition metal dichalcogenides (TMDs) are novel, and unlike graphene, gapped 2D materials with unique electrical and optical properties that are being explored for novel device applications. Their 2D nature also makes their properties sensitive to the surrounding environment. For example, a free standing monolayer of MoS2 - which has an experimentally reported direct band gap of Eg ≈ 1.8 eV1 - has a very low reported mobility (μ<;3 cm2/(V-s)),2 but exhibits significant enhancement of its mobility (μ~200 cm2/(V-s)) when superposed with a high-k dielectric like HfO2.3 Here, we study the effect of HfO2 and Al2O3 on monolayer MoS2 using density functional theory (DFT).
HfO2和Al2O3对MoS2单层电子结构的影响
过渡金属二硫族化合物(TMDs)是一种新颖的材料,与石墨烯不同,它具有独特的电学和光学特性,正在探索用于新型器件的应用。它们的二维特性也使它们的属性对周围环境很敏感。例如,一个独立的MoS2单层-实验报道其直接带隙为Eg≈1.8 eV1 -具有非常低的迁移率(μ2/(V-s)),2但当与高k介电物质如HfO2.3叠加时,其迁移率显著增强(μ~200 cm2/(V-s))。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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