Youngmin Jo, Anil Kavala, Tongsung Kim, Byungkwan Chun, Jungjune Park, Tae-Sung Lee, Jungmin Seo, Manjae Yang, Taehyeon Park, Hyunjin Kwon, C. Lee, Young-Dong Son, Junghwan Kwak, Younggyu Lee, Hwan-Seok Ku, Daehoon Na, Changyeon Yu, Jonghoon Park, Jaehwan Kim, Hyojin Kwon, Chan-ho Kim, M. Jung, Chanjin Park, Don-Iru Seo, Moosung Kim, Seungjae Lee, Jin-Yub Lee, Dongku Kang, Chiweon Yoon, Sunghoi Hur
{"title":"A 3.0 Gb/s/pin 4th generation F-chip with Toggle 5.0 Specification for 16Tb NAND Flash Memory Multi chip Package","authors":"Youngmin Jo, Anil Kavala, Tongsung Kim, Byungkwan Chun, Jungjune Park, Tae-Sung Lee, Jungmin Seo, Manjae Yang, Taehyeon Park, Hyunjin Kwon, C. Lee, Young-Dong Son, Junghwan Kwak, Younggyu Lee, Hwan-Seok Ku, Daehoon Na, Changyeon Yu, Jonghoon Park, Jaehwan Kim, Hyojin Kwon, Chan-ho Kim, M. Jung, Chanjin Park, Don-Iru Seo, Moosung Kim, Seungjae Lee, Jin-Yub Lee, Dongku Kang, Chiweon Yoon, Sunghoi Hur","doi":"10.23919/VLSITechnologyandCir57934.2023.10185391","DOIUrl":null,"url":null,"abstract":"A 1.2 V, 3.0 Gb/s/pin 16Tb NAND flash memory package with proposed 4th generation F-chip is presented. It is implemented with self-training techniques such as hybrid delay locked loop (DLL) and 3-step duty cycle correction (DCC) to overcome the speed bottlenecks in F-chip to NAND interface. Also, its multi-termination feature improves power efficiency by providing the use of different terminations on its interfaces. This work achieves an I/O speed of 3.0 Gb/s and power consumption of 58mW which are an improvement of 66% and 23.3%, respectively, in comparison with 3rd generation F-chip.","PeriodicalId":317958,"journal":{"name":"2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits)","volume":"65 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2023-06-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.23919/VLSITechnologyandCir57934.2023.10185391","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
A 1.2 V, 3.0 Gb/s/pin 16Tb NAND flash memory package with proposed 4th generation F-chip is presented. It is implemented with self-training techniques such as hybrid delay locked loop (DLL) and 3-step duty cycle correction (DCC) to overcome the speed bottlenecks in F-chip to NAND interface. Also, its multi-termination feature improves power efficiency by providing the use of different terminations on its interfaces. This work achieves an I/O speed of 3.0 Gb/s and power consumption of 58mW which are an improvement of 66% and 23.3%, respectively, in comparison with 3rd generation F-chip.