Dylan C. Stow, Itir Akgun, Russell Barnes, P. Gu, Yuan Xie
{"title":"Cost and Thermal Analysis of High-Performance 2.5D and 3D Integrated Circuit Design Space","authors":"Dylan C. Stow, Itir Akgun, Russell Barnes, P. Gu, Yuan Xie","doi":"10.1109/ISVLSI.2016.133","DOIUrl":null,"url":null,"abstract":"3D Integration is a promising technology to continue the trend of Moore's law. However, higher density from die stacking introduces thermal challenges that require more expensive packaging and cooling solutions. An alternative integration technology is interposer-based 2.5D design, which has fewer thermal issues but adds extra interposer cost. Designers must be aware of the system-level cost benefits of these choices early in the design process. This paper presents a cost analysis model with wafer costs, 3D bonding costs, and thermal modeling for the optimization of package and cooling costs. The cost model is used to explore the design space of integrated circuits to determine cost-driven enabling points of 2.5D and 3D integration under consideration of design size and power density. Our results suggest that proper use of die-integration technologies can realize substantial cost savings over traditional 2D design, even with the inclusion of packaging and cooling costs. When thermal properties are considered, interposer-based 2.5D integration is predicted to be more cost effective than TSV-based 3D integration, especially when power density is high.","PeriodicalId":140647,"journal":{"name":"2016 IEEE Computer Society Annual Symposium on VLSI (ISVLSI)","volume":"85 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-07-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"11","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 IEEE Computer Society Annual Symposium on VLSI (ISVLSI)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISVLSI.2016.133","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 11
Abstract
3D Integration is a promising technology to continue the trend of Moore's law. However, higher density from die stacking introduces thermal challenges that require more expensive packaging and cooling solutions. An alternative integration technology is interposer-based 2.5D design, which has fewer thermal issues but adds extra interposer cost. Designers must be aware of the system-level cost benefits of these choices early in the design process. This paper presents a cost analysis model with wafer costs, 3D bonding costs, and thermal modeling for the optimization of package and cooling costs. The cost model is used to explore the design space of integrated circuits to determine cost-driven enabling points of 2.5D and 3D integration under consideration of design size and power density. Our results suggest that proper use of die-integration technologies can realize substantial cost savings over traditional 2D design, even with the inclusion of packaging and cooling costs. When thermal properties are considered, interposer-based 2.5D integration is predicted to be more cost effective than TSV-based 3D integration, especially when power density is high.