ZnO Nanoneedle Based Efficient UV-Photodetector

A. Ibrahim, S. Roy, S. Kale
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Abstract

This article reports the fabrication and characterization of nano-structured ITO/ZnO ultraviolet photodetector. A ZnO thin film was deposited by spray pyrolysis technique followed by interdigitated ITO as electrode deposition by RF sputter. Grazing angle x-ray diffraction (GIXRD) study indicates preferential growth along c-axis (002) of thin-film leading nanoneedle formation which was further confirmed by scanning electron microscopy (SEM) imaging. X-ray photoelectron spectroscopy (XPS) analysis of Oxygen 1s (O 1s) was carried out. A peak was observed at 531.8 eV indicating the presence of oxygen vacancy, 530 eV peak relates to the ZnO phase. The bandgap was determined by the Tauc plot; which was found to be 3.22eV. The donor carrier concentration is found to be 8.85x10 18 cm -3 based on room temperature Hall measurement. A near ohmic behaviour was observed which can be interpreted by the existence of high carrier concentration in ZnO. This results in a very thin depletion width of the order of 5nm; therefore, charge transport through the junction is dominated by tunnelling of electrons through depletion width.
基于ZnO纳米针的高效紫外光电探测器
本文报道了纳米结构ITO/ZnO紫外探测器的制备与表征。采用喷雾热解法制备ZnO薄膜,然后采用射频溅射法制备交错状ITO电极。掠射角x射线衍射(GIXRD)研究表明,薄膜沿c轴(002)优先生长,导致纳米针形成,扫描电子显微镜(SEM)成像进一步证实了这一点。对氧1s (O 1s)进行了x射线光电子能谱(XPS)分析。在531.8 eV处有一个峰表示氧空位的存在,530 eV处有一个峰与ZnO相有关。带隙由Tauc图确定;结果为3.22eV。根据室温霍尔测量,供体载流子浓度为8.85x10 18 cm -3。观察到近欧姆行为,这可以解释为ZnO中存在高载流子浓度。这导致损耗宽度非常薄,约为5nm;因此,通过结的电荷输运主要是通过耗尽宽度的电子隧穿。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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