Radiation Hardening of FPGA-Based SoCs through Self-Reconfiguration and XTMR Techniques

A. Martín-Ortega, Maite Alvarez, S. Esteve, Santiago Rodriguez, Sergio Lopez-Buedo
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引用次数: 11

Abstract

SRAM-based FPGAs are increasingly being used in space applications. However, there are still many concerns about the reliability of these devices in high-radiation environments, particularly due to the possibility of single-event upsets (SEUs) in the configuration memory. This paper presents an architecture for implementing radiation-hardened SoCs based on FPGAs. Previous works used triple module redundancy (TMR) techniques together with scrubbing mechanisms based on partial reconfiguration. However, these solutions required external configuration controllers that increased the system complexity and deviated the design from the SoC principles. The proposed architecture uses novel self- reconfiguration techniques in order to eliminate the need for external components, so that a full radiation-hardened SoC can be implemented in a single FPGA. Since self- reconfiguration allows for on-board remote hardware updates, reliability is tackled at two key levels: Radiation- hardened operation and hardware upgradeability to solve design errors.
基于fpga的soc的自重构和XTMR技术的辐射硬化
基于sram的fpga越来越多地用于空间应用。然而,这些器件在高辐射环境下的可靠性仍然存在许多问题,特别是由于配置内存中存在单事件干扰(seu)的可能性。本文提出了一种基于fpga实现抗辐射soc的体系结构。以前的工作使用了三模块冗余(TMR)技术以及基于部分重构的擦洗机制。然而,这些解决方案需要外部配置控制器,这增加了系统的复杂性,并且偏离了SoC原则的设计。所提出的架构使用新颖的自重构技术,以消除对外部组件的需求,从而可以在单个FPGA中实现完整的抗辐射SoC。由于自我重新配置允许车载远程硬件更新,因此可靠性在两个关键级别上得到解决:抗辐射操作和硬件可升级性以解决设计错误。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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