{"title":"Capacitance-Based Voltage Regulation- and Reference-Free Temperature-to-Digital Converter down to 0.3 V and 2.5 nW for Direct Harvesting","authors":"O. Aiello, M. Alioto","doi":"10.1109/ESSCIRC55480.2022.9911378","DOIUrl":null,"url":null,"abstract":"A temperature-to-digital converter for direct harvesting is proposed, where no DC-DC conversion is required between the DC harvester and the system. Temperature-induced capacitance differences are read out through ring oscillator frequency. PVT variations are suppressed by the differential nature of the temperature sensor architecture, whereas mismatch is compensated via a self-referenced calibration procedure. No reference, regulator, digital post-processing and digital direct temperature readout is needed to retain true-nW and low-$V_{min}$ operation. A 180-nm testchip tested across corner wafers shows 7bit ENOB, 2.5-4.5nW from solar and thermal direct harvesting at 0.3-0.5 V, as representative of a very wide range of environmental conditions.","PeriodicalId":168466,"journal":{"name":"ESSCIRC 2022- IEEE 48th European Solid State Circuits Conference (ESSCIRC)","volume":"36 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2022-09-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"ESSCIRC 2022- IEEE 48th European Solid State Circuits Conference (ESSCIRC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ESSCIRC55480.2022.9911378","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
A temperature-to-digital converter for direct harvesting is proposed, where no DC-DC conversion is required between the DC harvester and the system. Temperature-induced capacitance differences are read out through ring oscillator frequency. PVT variations are suppressed by the differential nature of the temperature sensor architecture, whereas mismatch is compensated via a self-referenced calibration procedure. No reference, regulator, digital post-processing and digital direct temperature readout is needed to retain true-nW and low-$V_{min}$ operation. A 180-nm testchip tested across corner wafers shows 7bit ENOB, 2.5-4.5nW from solar and thermal direct harvesting at 0.3-0.5 V, as representative of a very wide range of environmental conditions.