Efficient Non-Binary Hamming Codes for Limited Magnitude Errors in MLC PCMs

Abhishek Das, N. Touba
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引用次数: 4

Abstract

Emerging non-volatile main memories (e.g. phase change memories) have been the continuous focus of research currently. These memories provide an attractive alternative to DRAM with their high density and low cost. But the dominant error models in these memories are of limited magnitude caused by resistance drifts. Hamming codes have been used extensively to protect DRAM due to their low decoding latency and low redundancy as well. But with limited magnitude errors, traditional Hamming codes prove to be inefficient. This paper proposes a new systematic limited magnitude error correcting non-binary Hamming code specifically to address limited magnitude errors in multilevel cell memories storing multiple bits per cell. A general construction methodology is presented to correct errors of limited magnitude and is compared to existing schemes addressing limited magnitude errors in phase change memories. A syndrome analysis is done to show the reduction in total number of syndromes for limited magnitude error models. It is shown that the proposed codes provide better latency and complexity compared to existing limited magnitude error correcting non-binary Hamming codes. It is also shown that the proposed codes achieve better redundancy compared to the symbol extended version of binary Hamming codes.
MLC PCMs中有限量级误差的高效非二进制汉明码
新兴的非易失性主存储器(如相变存储器)一直是当前研究的热点。这些存储器以其高密度和低成本为DRAM提供了一个有吸引力的替代品。但这些记忆中的主要误差模型是由阻力漂移引起的有限幅度。由于其低解码延迟和低冗余性,汉明码已广泛用于保护DRAM。但是由于误差幅度有限,传统的汉明码被证明是低效的。本文提出了一种新的系统有限幅度误差校正非二进制汉明码,专门用于解决每单元存储多比特的多级单元存储器中的有限幅度误差。提出了一种修正有限幅度误差的一般构造方法,并与现有的解决相变存储器中有限幅度误差的方法进行了比较。进行了综合征分析,以显示有限幅度误差模型的综合征总数的减少。结果表明,与现有的有限量级误差校正非二进制汉明码相比,所提出的码具有更好的延迟和复杂度。与二进制汉明码的符号扩展版本相比,所提出的码具有更好的冗余性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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