Efficient VLSI design for SIFT feature description

Yi-Ming Lin, Chun-Hsien Yeh, Sheng-Hung Yen, Ching-Hsuan Ma, Pei-Yin Chen, C.-C. Jay Kuo
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引用次数: 12

Abstract

The scale invariant feature transform (SIFT) is a very efficient algorithm to extract and describe distinctive invariant features from images, and usually applied for many image applications such as object recognition, robotic mapping, and navigation. In the SIFT computation, the complexity of the feature description is quite high. Hence, it is desirable to have an efficient VLSI architecture to compute the feature descriptor quickly. We first investigate the performance analysis for SIFT and then employ the proper hardware circuit to implement the feature description process. Besides, the pipelining technique is adopted to increase the speed of our design. Synthesis results show that the proposed circuit contains 555,062 transistors by using the TSMC 0.13µm cell library. It works with a clock rate of 200 MHz and can support the throughput rate of about 65300 SIFT descriptors per second in real time.
高效的VLSI SIFT特征描述设计
尺度不变特征变换(SIFT)是一种非常有效的从图像中提取和描述显著不变特征的算法,通常应用于物体识别、机器人映射和导航等图像应用。在SIFT计算中,特征描述的复杂度相当高。因此,需要一个高效的VLSI架构来快速计算特征描述符。我们首先研究SIFT的性能分析,然后采用适当的硬件电路来实现特征描述过程。此外,采用流水线技术,提高了设计速度。合成结果表明,该电路采用台积电0.13µm单元库,包含555,062个晶体管。它的时钟频率为200mhz,可以支持每秒65300个SIFT描述符的实时吞吐率。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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