Non-Linear RF Modeling of GaN HEMTs with Industry Standard ASM GaN Model (Invited)

Abstract

In this paper, we present nonlinear radiofrequency (RF) modeling of Gallium Nitride based high electron mobility transistors (GaN HEMTs) using recently selected industry standard surface-potential-based Advance SPICE Model (ASM) for GaN HEMTs. We describe the key features of ASM GaN model from user perspective. Non-linear RF modeling flow from DC to small-signal to large-signal characteristics is presented for GaN HEMTs.