Uncertainties assessment of noise parameters in D- band using in situ tuner techniques

Abstract

When transistor noise characterization becomes a difficult task at millimeter wave range, the accuracy on the resulting noise parameters is not or poorly discussed. Within this context, this paper aims to present a methodology to estimate the uncertainties related to the extraction of the four noise parameters when using in situ tuner techniques, in the 130-170 GHz frequency range. B9MW SiGe HBT from STMicroelectonics was used as a test vehicle for the noise characterization and uncertainties assessment.