New layout design methodology for monolithically integrated 3D CMOS logic circuits based on parasitics engineering

C. Tanaka, K. Ikeda, M. Saitoh
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Abstract

We propose a new layout design methodology for monolithically integrated 3D CMOS logic circuits based on parasitics engineering. In order to understand the impact of parasitics in monolithic 3D-stacked CMOS circuits, careful analysis of intra- and inter- layer parasitic capacitances were performed by using physics-based RC extractor for realistic 3D structure. As a result, we found that separation of power-supply (Vdd) and ground-line (GND) layer from logic elements is a key to reduce the parasitic capacitance thanks to be suppressed electrical coupling between stacked layers. By comparative evaluation among possible 3D layer configurations, we revealed that the best configuration is Vdd and GND layer sandwiched between nFET and pFET logic layers. Performance benchmarking by energy consumption-switching delay demonstrated that a 40% improvement of energy-delay product at Vdd = 0.5 V can be achieved by using a proposed layout methodology.
基于寄生工程的单片集成三维CMOS逻辑电路版图设计新方法
提出了一种基于寄生工程的单片集成三维CMOS逻辑电路版图设计新方法。为了了解寄生对单片3D堆叠CMOS电路的影响,利用基于物理的RC提取器对真实3D结构进行了层内和层间寄生电容的仔细分析。因此,我们发现电源(Vdd)和地线(GND)层与逻辑元件的分离是降低寄生电容的关键,因为它抑制了堆叠层之间的电耦合。通过对各种可能的三维层配置进行比较评估,我们发现最佳配置是夹在nFET和pFET逻辑层之间的Vdd和GND层。通过能量消耗开关延迟的性能基准测试表明,使用所提出的布局方法可以在Vdd = 0.5 V时实现40%的能量延迟产品改进。
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