Integrated circuit (IC) aging effects on radio-frequency distinct native attributes (RF-DNA)

Abstract

Device discrimination using RF-DNA utilizes the uniqueness resulting from integrated circuit (IC) manufacturing process variation. As an IC ages toward wear-out failure, internal physical alterations may impart additional changes on the order of initial process variations. This paper proposes exploration of: 1) the impact of aging on RF-DNA discrimination reliability, and 2) a means to monitor IC aging using RF-DNA.