Preparation of B-Si films by chemical vapor deposition

M. Mukaida, T. Tsunoda, Y. Imai
{"title":"Preparation of B-Si films by chemical vapor deposition","authors":"M. Mukaida, T. Tsunoda, Y. Imai","doi":"10.1109/ICT.1999.843475","DOIUrl":null,"url":null,"abstract":"B-Si films were prepared by chemical vapor deposition (CVD) using high-frequency induction heating. Mixed gases of silane and diborane were used as source materials. The deposits were prepared on a graphite substrates at the substrate temperature between 1188 and 1616 K under the total pressure in the CVD chamber of 2.7 kPa. The molar ratio of B/Si in the source gas was 6 to 60. At lower B/Si Ratio in the source gas, SiB/sub 4/ was formed. SiB/sub 6/ and SiB/sub n/ could be also formed at the higher ratios of B/Si. And, the deposit was dependent on the substrate temperature. The deposit with higher B concentration was obtained with increasing the substrate temperature. The electrical properties such as Seebeck coefficient and electrical conductivity of the films were measured.","PeriodicalId":253439,"journal":{"name":"Eighteenth International Conference on Thermoelectrics. Proceedings, ICT'99 (Cat. No.99TH8407)","volume":"67 1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1999-08-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Eighteenth International Conference on Thermoelectrics. Proceedings, ICT'99 (Cat. No.99TH8407)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICT.1999.843475","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 4

Abstract

B-Si films were prepared by chemical vapor deposition (CVD) using high-frequency induction heating. Mixed gases of silane and diborane were used as source materials. The deposits were prepared on a graphite substrates at the substrate temperature between 1188 and 1616 K under the total pressure in the CVD chamber of 2.7 kPa. The molar ratio of B/Si in the source gas was 6 to 60. At lower B/Si Ratio in the source gas, SiB/sub 4/ was formed. SiB/sub 6/ and SiB/sub n/ could be also formed at the higher ratios of B/Si. And, the deposit was dependent on the substrate temperature. The deposit with higher B concentration was obtained with increasing the substrate temperature. The electrical properties such as Seebeck coefficient and electrical conductivity of the films were measured.
化学气相沉积法制备B-Si薄膜
采用化学气相沉积(CVD)高频感应加热法制备了B-Si薄膜。以硅烷和二硼烷混合气体为原料。沉积在石墨衬底上,衬底温度为1188 ~ 1616 K, CVD室总压为2.7 kPa。源气中B/Si的摩尔比为6∶60。气源B/Si比较低时,形成SiB/sub - 4/。在较高的B/Si比下也可形成SiB/sub 6/和SiB/sub n/。沉积与衬底温度有关。随着衬底温度的升高,镀层的B浓度升高。测定了薄膜的塞贝克系数和电导率等电学性能。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:604180095
Book学术官方微信