Fabrication and quantitative characterization of super smooth surface with sub-nanometer roughness

Zhengxiang Shen, Bin Ma, T. Ding, Xiaoqiang Wang, Zhanshan Wang, Lishuan Wang, Hua-song Liu, Yi-qin Ji
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引用次数: 1

Abstract

There is a growing requirement to use supersmooth surfaces with roughness in the sub-nanometer range. But, to produce 100mm-diameter optical elements with ultra-flat and supersmooth surfaces is still difficult. The fabrication technique based on continues polishing process is presented to produce flat optical element with extremely smooth surface. During the fabrication, A concept of "Process Controlling" is introduced, which means the machining of super-smooth surfaces is considered as a chain consisted of some key nodes, not merely a polishing process. The surface figure is tested using interferometer and the surface roughness is using interference microscopy and atom force microscopy (AFM) repectively. Then the Power Spectral Density (PSD) function, including the basic theory and the physical meaning, are presented to explain the difference of test results, which is measured by optical profiler and AFM with different parameters. The polynomial fitting results indicate that there is excellent agreement between measurements made by the two instruments.
亚纳米超光滑表面的制备与定量表征
使用亚纳米范围内粗糙度的超光滑表面的需求日益增长。但是,要生产具有超平面和超光滑表面的直径为100mm的光学元件仍然是困难的。提出了一种基于连续抛光工艺的平面光学元件制造技术。在制造过程中,引入了“过程控制”的概念,即将超光滑表面的加工视为由一些关键节点组成的链条,而不仅仅是抛光过程。用干涉仪对表面形貌进行了测试,用干涉显微镜和原子力显微镜对表面粗糙度进行了测试。然后介绍了功率谱密度函数(PSD)的基本理论和物理意义,解释了不同参数下光学轮廓仪和原子力显微镜测量结果的差异。多项式拟合结果表明,两种仪器的测量结果有很好的一致性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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