Test board design and measurement techniques for high-frequency fully-differential CMOS OTAs

Proceedings. Tenth Annual IEEE International ASIC Conference and Exhibit (Cat. No.97TH8334) Pub Date : 1997-09-07 DOI:10.1109/ASIC.1997.617030

D. Hsiu-Chun Chiang, R. Schaumann, W. R. Daasch

引用次数: 1

Abstract

Experimental procedures and a versatile circuit board designed for testing fully-differential CMOS OTAs are presented. The techniques can be used to measure most DC and AC parameters of an OTA. The approach used leads to guidelines for OTA design.

查看原文本刊更多论文

高频全差分CMOS ota测试板设计与测量技术

实验程序和一个通用的电路板设计用于测试全差分CMOS ota。该技术可用于测量OTA的大多数直流和交流参数。所使用的方法为OTA设计提供了指导方针。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

求助全文

约1分钟内获得全文求助全文

来源期刊

Proceedings. Tenth Annual IEEE International ASIC Conference and Exhibit (Cat. No.97TH8334)

自引率

0.00%

发文量