Total dose and heavy ion evaluation of a hardened RISC microcontroller

Abstract

This paper presents an evaluation methodology of the total dose and heavy ion response based on utilising the integrated test resources of the IEEE 1149.1 (JTAG) standard. The FLAME microcontroller (compatible with the SPARC/sup TM/ V8 architecture), fabricated in the Honeywell SSEC SOI RICMOS/sup TM/ IV technology, is used to validate the method.