Reliability Analysis of a RF Product with Improved Quality for the Prediction of Failure Probabilities

Abstract

The simulation-based analyses of production yield losses are still in the early stage. With the possibility to use input parameters with a stochastic distribution, taking in account the manufacturing tolerances, and with the ability to calculate failure probabilities these analyses become nowadays possible.The approach shown here for a RF product can give useful insights for the reduction of the production yield loss, ideally already in the early design stage of the manufacturing process itself.