Strain engineering of single-layer MoS2

Manouchehr Hosseini, M. Elahi, E. Soleimani, M. Pourfath, D. Esseni
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Abstract

In this work the effect of biaxial and uniaxial strain on the mobility of single-layer MoS2 at room temperatures is comprehensively studied. Scattering from intrinsic phonon modes, remote phonon and charged impurities are considered along with static screening. Ab-initio simulations are utilized to investigate the strain induced effects on the electronic bandstructure and the linearized Boltzmann transport equation is used to evaluate the low-field mobility under various strain conditions. The results indicate that the mobility increases with tensile biaxial and tensile uniaxial strain along the armchair direction. Under compressive strain, however, the mobility exhibits a nonmonotonic behavior when the strain magnitude is varied. In particular, with a relatively small compressive strain of 1% the mobility is reduced by about a factor of two compared to the unstrained condition, but with a larger compressive strain the mobility partly recovers such a degradation.
单层MoS2的应变工程
本文全面研究了室温下双轴应变和单轴应变对单层二硫化钼迁移率的影响。从本征声子模式,远声子和带电杂质散射考虑与静态筛选。利用Ab-initio模拟研究了应变对电子带结构的影响,并利用线性化玻尔兹曼输运方程评估了不同应变条件下的低场迁移率。结果表明:沿扶手椅方向,随拉伸双轴应变和拉伸单轴应变的增加,迁移率增大;而在压缩应变下,随应变大小的变化,其迁移率表现出非单调性。特别是,在相对较小的压缩应变为1%的情况下,与未应变条件相比,迁移率降低了约两倍,但在较大的压缩应变下,迁移率部分恢复了这种退化。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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