T. Y. Wu, Y. S. Chen, P. Gu, W. Chen, H. Y. Lee, P. S. Chen, K. Tsai, C. Tsai, S. Z. Rahaman, Y. D. Lin, F. Chen, M. Tsai, T. Ku
{"title":"Vertical resistive switching memory (VRRAM): A real 3D device demonstration and analysis of high-density application","authors":"T. Y. Wu, Y. S. Chen, P. Gu, W. Chen, H. Y. Lee, P. S. Chen, K. Tsai, C. Tsai, S. Z. Rahaman, Y. D. Lin, F. Chen, M. Tsai, T. Ku","doi":"10.1109/VLSI-TSA.2014.6839683","DOIUrl":null,"url":null,"abstract":"The design, cost, and the operation methodology in the 2-terminal and 3-terminal VRRAM devices are studied. The real 3D vertical-contact RRAM devices are also demonstrated and the devices showed good memory performance. A self-rectifying device is proposed to suppress the sneak current in the VRRAM.","PeriodicalId":403085,"journal":{"name":"Proceedings of Technical Program - 2014 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA)","volume":"19 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2014-04-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of Technical Program - 2014 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/VLSI-TSA.2014.6839683","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
The design, cost, and the operation methodology in the 2-terminal and 3-terminal VRRAM devices are studied. The real 3D vertical-contact RRAM devices are also demonstrated and the devices showed good memory performance. A self-rectifying device is proposed to suppress the sneak current in the VRRAM.