P. Magarshack
{"title":"Building yield into systems-on chips for nanometer technologies","authors":"P. Magarshack","doi":"10.1109/VTEST.2003.1197624","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":292996,"journal":{"name":"Proceedings. 21st VLSI Test Symposium, 2003.","volume":"530 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2003-05-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings. 21st VLSI Test Symposium, 2003.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/VTEST.2003.1197624","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0