M. Wieczorowski, Dawid Kucharski, P. Sniatala, G. Królczyk, P. Pawlus, B. Gapiński
{"title":"Theoretical considerations on application of artificial intelligence in coordinate metrology","authors":"M. Wieczorowski, Dawid Kucharski, P. Sniatala, G. Królczyk, P. Pawlus, B. Gapiński","doi":"10.1109/NanofIM54124.2021.9737344","DOIUrl":null,"url":null,"abstract":"Artificial intelligence and solution-finding methods based on it are becoming more and more common not only in science, but also in everyday life. It is one of the important elements of Industry 4.0 strategy, supporting human in making decisions especially based on large sets of input data. Also in length and angle metrology, opportunities are opening up to use artificial intelligence to solve technical issues. This is not only related to technology, but also to the social factor. With increasing problems related to the availability of highly qualified staff, the use of artificial intelligence methods in the selection of measurement strategy, measurement conditions, filtration techniques and other elements affecting the implementation of the measurement process and obtaining a correct measurement result, becomes a necessity. This paper discusses the possibilities of using artificial intelligence in length metrology. In the macro scale the selection of the measurement strategy and measurement conditions for contact and non-contact technology devices is presented. On a micro scale, the possibility of selecting filtration techniques and unevenness parameters for functional applications is shown.","PeriodicalId":130801,"journal":{"name":"2021 6th International Conference on Nanotechnology for Instrumentation and Measurement (NanofIM)","volume":"22 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2021-11-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2021 6th International Conference on Nanotechnology for Instrumentation and Measurement (NanofIM)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/NanofIM54124.2021.9737344","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 4
Abstract
Artificial intelligence and solution-finding methods based on it are becoming more and more common not only in science, but also in everyday life. It is one of the important elements of Industry 4.0 strategy, supporting human in making decisions especially based on large sets of input data. Also in length and angle metrology, opportunities are opening up to use artificial intelligence to solve technical issues. This is not only related to technology, but also to the social factor. With increasing problems related to the availability of highly qualified staff, the use of artificial intelligence methods in the selection of measurement strategy, measurement conditions, filtration techniques and other elements affecting the implementation of the measurement process and obtaining a correct measurement result, becomes a necessity. This paper discusses the possibilities of using artificial intelligence in length metrology. In the macro scale the selection of the measurement strategy and measurement conditions for contact and non-contact technology devices is presented. On a micro scale, the possibility of selecting filtration techniques and unevenness parameters for functional applications is shown.