Hierarchical test coverage

Abstract

The IOX productivity enhancement required to produce submicron, System On Silicon (SOS) products will come from high level synthesis and design reuse. SOS products will have an infrastructure which preserves the hierarchical structure of the original conceptual thinking. Time to market and quality goals will require the use of previously created and optimized tests for embedded subsystems. Production tests for embedded subsystems will be abstracted from the hierarchical structure of the SOS product. The solution presented describes a method for encapsulating hierarchical information within a test program. A tester architecture to facilitate hierarchical testing is also presented.