An efficient multiple scan chain testing scheme

Abstract

In this paper an improved multiple scan chain testing scheme to enhance stuck-at and delay fault testing is proposed. With judicial selection of taps from an n stage CA generator, correlation within a multiple input scan chain is reduced. Adopting the multiple scan chains fed by the selected taps of the CA generator also eases the difficulty of arranging shift register latches (SRLs) for scan based pseudo-exhaustive stuck-at fault testing.