Practical Dynamic Laser Stimulation Technique and Code Modification: A Soft Defect Localization Approach for Microcontroller Self-Test Failures

Abstract

A practical alternative for soft defect localization (SDL) and fault isolation of dynamic failures is presented. The approach utilizes an existing optical beam induced resistance change (OBIRCH) hardware without a dynamic laser stimulation (DLS) add-on kit, coupled with an exhaustive electrical sample prep step which involves code modification. The technique was proven effective in localizing failures pertaining to resistive interconnects which are rather difficult to analyze using conventional static techniques.