C. Jeong, Sanghoon Myung, Byungseon Choi, Jinwoo Kim, Wonik Jang, I. Huh, Jae Myung Choe, Young-Gu Kim, Dae Sin Kim
{"title":"Deep Learning for Semiconductor Materials and Devices Design","authors":"C. Jeong, Sanghoon Myung, Byungseon Choi, Jinwoo Kim, Wonik Jang, I. Huh, Jae Myung Choe, Young-Gu Kim, Dae Sin Kim","doi":"10.1109/EDTM55494.2023.10103098","DOIUrl":null,"url":null,"abstract":"This paper provides two examples of use cases of deep learning (DL) in the fabrication and design of modern semiconductor devices: modeling of plasma dry-etching process and transistor performance. The use cases demonstrate an improved version of DL model in terms of model accuracy and prediction time by incorporating scientific knowledge into DL.","PeriodicalId":418413,"journal":{"name":"2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)","volume":"182 6 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2023-03-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EDTM55494.2023.10103098","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
This paper provides two examples of use cases of deep learning (DL) in the fabrication and design of modern semiconductor devices: modeling of plasma dry-etching process and transistor performance. The use cases demonstrate an improved version of DL model in terms of model accuracy and prediction time by incorporating scientific knowledge into DL.