{"title":"Error estimators of discreteness while gaging the RMS of periodic signals","authors":"M. M. Babichev, Y.A. Pasynkov","doi":"10.1109/APEIE.2014.7040898","DOIUrl":null,"url":null,"abstract":"Therein under, the document covers the reasons of outliers' appearance upon the observation error function of discreteness when changing a sample rate in an analog-to-digital converter (ADC) which is used for measurement of the signal's root mean square (RMS). We evaluate an upper bound for measurement uncertainty of discreteness depending on a number of bits in the ADC.","PeriodicalId":202524,"journal":{"name":"2014 12th International Conference on Actual Problems of Electronics Instrument Engineering (APEIE)","volume":"71 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2014-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2014 12th International Conference on Actual Problems of Electronics Instrument Engineering (APEIE)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/APEIE.2014.7040898","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
Therein under, the document covers the reasons of outliers' appearance upon the observation error function of discreteness when changing a sample rate in an analog-to-digital converter (ADC) which is used for measurement of the signal's root mean square (RMS). We evaluate an upper bound for measurement uncertainty of discreteness depending on a number of bits in the ADC.